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High-sensitivity and high-speed inspection of large glass substrates
This is an inline high-speed inspection system for large sheet glass products such as glass for FPD. It detects a wide variety of defects on the surface, interior, and edges of the glass with high sensitivity. Options for thickness measurement, length measurement, crack detection, and waviness detection are also available.
The optimal imaging inspection device for TGV inspection has been completed!
By using high-resolution 2D and 3D cameras, and combining them with NIR (near-infrared), we have achieved the detection of all types of defects. In addition to conventional high-precision surface inspection, it is now possible to measure internal defects and depth using NIR. Furthermore, the range of compatible materials has expanded beyond just glass to include SiC/silicon wafers, ABF films, and more. Please feel free to contact us.
